USNC TAG for IEC TC 113

This is the home page for the U.S. National Committee Technical Advisory Group (TAG) for International Electrotechnical Commission (IEC) Technical Committee No. 113 (TC 113), Nanotechnology standardization for electrical and electronic products and systems.

The TC 113 TAG is the vehicle by which U.S. manufacturers of nano-enabled electrotechnical products create a favorable international business model for their companies and their industry. This is because the TAG is the forum for developing standards for the characterization of nanoscale-attributes and the reliability and durability of nano-scale subassemblies.

Historically, standards have driven the commercial landscape and have accelerated the commercialization and mass production of new technologies. Nanotechnology for the electrical and electronic sectors will be no different. The U.S. has the largest nanotechnology manufacturing base in the world. This presents us with countless opportunities for breakthroughs from industry and the scientific community that will lead to safer and more functional products, including renewable sources of electricity for home and transportation needs, flexible video displays, and compact electronic devices. But if we aren’t proactive in standardization work for this emerging field, other countries and regions around the world will prevail in setting those standards for us and put us at a competitive disadvantage as mass production expands. Nanomaterial suppliers and product development experts in nano-electrotechnical measurements and performance assessments are urged to join the TC 113 TAG and help the U.S. lead in this vital work.

Membership is open to all U.S. stakeholders in nanotechnology, but requires application through the TAG Secretary and Technical Advisor, and approval by the TAG membership.  TAG activities are governed by its approved Operating Procedures.

TAG members: Click here for the members-only pages.

Technical Advisor - Dr. Brent Segal
TAG Secretary - Mike Leibowitz

Scope of TC 113

Standardization of the technologies relevant to electrical and electronic products and systems in nanotechnology, in close cooperation with other committees of the IEC and ISO TC 229.

Click here to learn about IEC TC 113, including officers, member countries and the Committee's Strategic Policy Statement.

Structure of TC 113

TC 113 is composed of the following:

IEC TC 113-ISO TC 229 Joint Working Group 1 (JWG1), Terminology
IEC TC 113-ISO TC 229 Joint Working Group 2 (JWG2), Measurement and instrumentation
IEC TC 113 Working Group 3 (WG3), Performance assessment
WG3 Task Group 1, TC 113 Standardization roadmap
WG3 Task Group 2, IEC Technical Report for nanoscale contacts

Click here to view a presentation on the TC 113 structure and work program made by TC 113 Chairman Dr. J. Thomas Chapin before the IEC Standardization Management Board at its February 12, 2008 meeting in Geneva. Use normal view to see the explanatory notes for each slide.

TC 113 Program of Work

TC 113 is engaged in the following work projects:

1 - IEC TS 62565: Guideline specification for single walled carbon nanotubes for electrotechnical applications. This is in the Committee Draft stage

2 - IEC/ISO TS 62607, Technical Specification for the Electrical Characterization of Carbon Nanotubes Using 4-probe Measurement.  This is in the working draft stage.

3 - IEC/IEEE 62624, Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes.  A maintenance cycle will begin in 2010.

4 - IEC/IEEE TS 62659, Large scale manufacturing of nanoelectronics.  This is an approved new work item.  Development work will begin in early 2010.

5 - IEC 62xxx, Technical Report on nanoscale electrical contacts.  Development work will begin in 2010.

6 - IEC 62xxx, Technical Report for the TC 113 Nanoelectronics standardization roadmap

7 - Development of IEC 62607-3-1, a U.S.-led New Work Item Proposal for determining the quantum efficiency of luminescent nanoparticles, is in progress.  This will be introduced into the IEC in the first quarter of 2010.

8 - IEC/ISO TS 13278, Determination of metal impurities in carbon nanotubes using inductively coupled plasma-mass spectroscopy.  Development work for this technical specification will begin in 2010.

9 - IEC/ISO TS 62622, Artificial gratings used in nanotechnology - Description and measurement of dimensional quality parameters.  This technical specification is in the working draft stage.

9 - ISO/IEC TS 10797, Technical Specification for Characterization of single-wall carbon nanotubes using transmission electron microscopy (TEM).  This is in the working draft stage.

10 - Synergistic activity with the ANSI Accredited U.S. TAG to ISO/TC 229, Nanotechnology pertaining to JWG1 and JWG2.

Become a TAG member today!

Why should you become a TAG member?  Because standardization drives the commercial landscape!  Whoever drives standards holds the high ground on the commercialization of their products.  If you don't drive, you follow!

Membership on the TC 113 TAG affords you a voice in IEC standards work, including:

- Access to the members-only pages including TC 113 working documents
- Voting rights in the formulating of U.S. National Committee positions
- The opportunity to introduce or contribute to new work proposals
- The opportunity to comment on working drafts
- Eligibility to lead in standards projects
- Representation in international working groups and plenary sessions

Contact us to join or for questions.  When formally requesting membership, please complete and submit a TAG application along with your professional resume and organizational letter of support.

Events Calendar

October 18-21, 2009
IEC TC 113 and ISO TC 229 Plenary and WG meetings in Tel Aviv, Israel in conjunction with the 2009 IEC General Meeting

November 30, 2009
IEC TC 113 TAG, in Boston, MA in conjunction with the MRS Fall 2009 meeting

April 5-9, 2010
TC 113 TAG meeting in San Francisco, CA in conjunction with the MRS Spring 2010 meeting

April 20-22, 2010
TC 113 WG3 and Project Team meetings
Seoul, Korea (tentative)

May 17, 2010
NIST Workshop for Metrology and Standards for Nanoelectronics: More than Moore Applications in Grenoble, France

June 21-25, 2010
IEC TC 113 TAG meeting in Anaheim, CA conjunction with Nanotech 2010, NSTI Conference and Expo

August 17-20, 2010

IEEE Nano 2010 in Kintex, Islan, Gyeonggi-Do, Korea

October 11-15, 2010
IEC TC 113 and its WG3 and PT's in Seattle, WA in conjunction with the 2010 IEC General Meeting

November 30-December 2, 2010
IEC TC 113 TAG in Boston, MA in conjunction with the MRS Fall 2010 meeting

October 24-28, 2011
IEC General Meeting in Melbourne, Australia

October 8-12, 2012
IEC General Meeting in Oslo, Norway

Articles, Papers and Presentations of Interest

Interview with Dr. Mike Roco, primary coordinator of the U.S. nanotechnology science, engineering, and technology effort
IEC TC 113 Nano-Electrotechnical Standardization Gains Momentum
IEC e-tech February 2008, Technology Focus: Nanotechnology standardization
Presentation: Measurements and Standards for Accelerating Innovation in Medical Imaging, by Dr. Herbert Bennett, NIST