USNC TAG for IEC/TC 113

This is the home page for the U.S. National Committee Technical Advisory Group (TAG) for International Electrotechnical Commission (IEC) Technical Committee No. 113 (TC 113), Nanotechnology standardization for electrical and electronic products and systems.

The TAG is responsible for the development of U.S. positions on draft documents and proposals distributed by IEC/TC 113 and the development of U.S. proposals to be submitted to IEC/TC 113. Membership is open to all U.S. interested and affected parties, but requires application through the TAG Administrator and Technical Advisor, with approval by the TAG membership.  TAG activities are governed by its approved Operating Procedures.

TAG members: Click here for the members-only pages.

Technical Advisor - Dr. Brent Segal
TAG Administrator - Mike Leibowitz

Scope of TC 113

Standardization of the technologies relevant to electrical and electronic products and systems in nanotechnology, in close cooperation with other committees of the IEC and ISO TC 229.

Click here to learn about IEC/TC 113, including officers, member countries and the Committee's Strategic Policy Statement.

Structure of TC 113

TC 113 is composed of the following:

IEC/TC 113-ISO/TC 229 Joint Working Group 1 (JWG1), Terminology
IEC/TC 113-ISO/TC 229 Joint Working Group 2 (JWG2), Characterization
TC 113 Working Group 3, Performance assessment

Click here to view a presentation on the TC 113 structure and work program made by TC 113 Chairman Dr. J. Thomas Chapin before the IEC Standardization Management Board at its February 12, 2008 meeting in Geneva. Use normal view to see the explanatory notes for each slide.

TC 113 Program of Work

International nanotechnology standardization for electrotechnical applications currently involves the following:

1 - Development of a new international guideline for carbon nanotube specifications for electrotechnical applications. This is the first technical document in progress from TC 113.

2 - Development of a new work proposal for nanoscale electrical contacts

3 - Consideration of a new work proposal for terminology for nano-optics

4 - Consideration of a new work proposal to extend the electrotechnical vocabulary for nanotechnology

5 - We expect IEEE 1650, Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes, to be proposed as a dual-logo IEC/IEEE standard in the near future, in order that new maintenance work on this standard can be initiated.

6 - We expect (draft) IEEE 1690, Standard Methods for the Characterization of Carbon Nanotubes Used as Additives in Bulk Materials to also be proposed as a joint  IEC/IEEE standard once the IEEE membership approves it. This document is still under development.

7 - Involvement in the activities of the ANSI Accredited U.S. TAG to ISO/TC 229, Nanotechnology pertaining to JWG1 and JWG2.   IEC/TC 113 plans to conduct a survey of the international nanotechnology community in order to establish work priorities in nano-electrotechnical standardization.  After this survey is conducted, an influx of proposed new projects from active participating member countries is expected to occur, which will involve both the IEC and ISO committees.

8 - The TAG hopes to lead in the establishment of a new working group within TC 113 to address environment, health and safety (EHS).  The January 24, 2008 (draft) EPA Nanomaterial Research Strategy provides an impetus for electrotechnical focus on EHS aspects of the nanomaterial life cycle.

Become a TAG member today!

Membership on the TC 113 TAG affords you:

Access to the members-only pages including TC 113 working documents!
A voice in IEC standards work!
Voting rights in the formulating of U.S. positions!
Opportunities to introduce proposals for new work and comment on working drafts!
Eligibility to lead in standards projects!
Representation on the working group and plenary levels!

Contact us to join or for questions.  When formally requesting membership, please complete and submit a TAG application along with your professional resume and organizational letter of support.

Events Calendar

TC 113 TAG, May 12, 2008, teleconference
NSTI Nanotech 2008, June 1-5, 2008, Boston, MA
SEMICON West 2008, July 15-17, 2008, San Francisco, CA
IEEE Nano 2008, August 18-21, 2008, Arlington, TX
Micro Nano Breakthrough Conference, September 8-10, 2008, Vancouver, WA
NanoTX USA '08, October 2-3, 2008, Dallas, TX
IEC TC 113 WG3, Performance assessment, November 11-12, 2008 at NIST, Gaithersburg, MD
IEC TC 113 Plenary Meeting, November 13, 2008, at NIST, Gaithersburg, MD

Articles, Papers and Presentations of Interest

Interview with Dr. Mihail Roco, primary coordinator of the U.S. nanotechnology science, engineering, and technology effort
IEC/TC 113 Nano-Electrotechnical Standardization Gains Momentum
IEC e-tech February 2008, Technology Focus: Nanotechnology standardization
Presentation: Measurements and Standards for Accelerating Innovation in Medical Imaging, by Dr. Herbert Bennett, NIST