TC 113 is composed of the following:
- IEC TC 113-ISO TC 229 Joint Working Group 1 (JWG1), Terminology
- IEC TC 113-ISO TC 229 Joint Working Group 2 (JWG2), Measurement and instrumentation
- IEC TC 113 Working Group 3 (WG3), Performance assessment
- WG3 Task Group 1, TC 113 Nanoelectronics standards roadmap
- WG3 Task Group 2, IEC Technical Report for nanoscale contacts and interconnects
Click here to view a presentation on the TC 113 structure and work program made by former TC 113 Chairman Dr. J. Thomas Chapin before the IEC Standardization Management Board at its February 12, 2008 meeting in Geneva.
Use normal view to see the explanatory notes for each slide.